Measuring Made Easy®
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Support CD with FISCHER DataCenter software for evaluating and archiving measured values, as well as PC-DATEX software for exporting data to Excel Price includes carrying case, operating instructions, shoulder strap, connection cable for FMP/PC, USB driver and battery set. Probes and calibration standards not included. Find important and brochures, catalogs and other downloads at the Fischer Technology download center. Find exactly what you're looking for here! Diver Hertha Schieche and swimmer Helmuth Fischer - undated- Photographer: Presse-Illustrationen Heinrich Hoffmann- Published by: 'Die Gruene Post' 24/1935Vintage property of ullstein bild Get premium, high resolution news photos at Getty Images. Benchtop Units, MMS-PC, MMS-PC2, Support Stands, Handheld and Pocket Instruments, FMP10-40, FMP100-150.
FAST and accurate Quality Control for electroless nickel platers
Knowing the %phosphorus in your electroless nickel plating operation is the key to accurate coating thickness measurement and the determination of other mechanical properties. Please use the button below to download a recording of the webinar.
Still measuring electroless nickel coatings with magnetic induction or hall effect instruments? Now is the time to upgrade your electroless nickel plating operation and begin using measurement instruments that determine the coating properties you need to know. It’s essential for platers to know the percentage of phosphorus content and how it can change the electroless nickel in plating operations. A change in phosphorus content can affect critical properties like mechanical properties, solderability, corrosion resistance and electrical conductivity which ultimately affects the overall quality of the finished coating.
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Conveniently, Fischer’s XRF instruments make it easy to measure both the thickness of the coating and determine the percentage of phosphorus in electroless nickel accurately. Knowing these factors allows electroless nickel platers the peace of mind in that their coatings are the exact thickness and composition they need to adhere to customer standards.
- Versatile instrument to measure thick and thin films
- Measure electroplated thicknesses and compososition
- Multiple collimator sizes to meet application needs
- User selectable primary filters to optimize measurements
- Programmable X/Y stages to automate measurements
- Microfocus X-ray tube
Fischer benchtop units exceed the capabilities of handheld gages by offering more and different measurement techniques. With COULOSCOPE® CMS2 and COULOSCOPE® CMS2 STEP, literally any metallic layer, even multi-layers, can be measured on any substrate.
- Destructive Testing
- Not affected by nickel’s magnetic properties
- Calibration Standards Available
- Only way to differentiate different nickel layers
- Not high volume
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- Magnetic or Eddy Current Methods
- Probe style gauge, large parts available
- Cost Effective
- Individualized standards required
- Sensitive to electric properties
- Periodic review of the calibration standards